Flasherly wrote:
Beyond variances between NAND type and design, for JEDEC claims
interpretively given unrefreshed SSD memory, within an inoperable
stasis for an least affected, pure state of hypothetical storage, that
data loss is a potential factor within a week;- whereas another and
proposition given a web-based hardware site is one of related
temperature coefficients, such that the lower temperature measure over
storage, than what characteristically a SSD is designed to operate at
upon being written to, is a (presumption the) lower subsequent
inoperable temperature will relate adversely upon expected longevity
of data cohesion (an extensively suppositional if populist allowance
at quite some leeway exceeding a former JEDEC's published reception).

(And apt dated for an observation posted five years ago in a
server-type forum.)

There may be some observations possible at end-of-life,
but generally not seen during normal life period.

Writing at low temperature, increases damage to flash cells
but the data lasts longer.

Writing at high temperature, comes closer to annealing,
reduces wear, but may also have the data lasting less long.

Powerful ECC is used to hide these factors and make the
device function for 3000 writes on TLC (less for QLC).

Paul